Silicon Photonics Wafer Test System 'SWT5100'
High-performance wafer-level test system compatible with wafers from 8 inches to 12 inches!
The "SWT5100" is a high-performance wafer-level test system designed for automated testing of silicon photonics wafers. It offers a fully automated testing process from wafer loading to optical alignment. Equipped with a chuck capable of temperature control from 25°C to 150°C, it supports optical, DC, and RF testing. It accommodates both GC and EC coupling and can be flexibly configured from single fibers to fiber arrays. 【Main Specifications (Partial)】 ■ Supported Wafer Size: 8 to 12 inches ■ Supported Wafer Thickness: 200 to 2000 um ■ Chuck Temperature Range: 25°C to 150°C ■ Supported Tests: Optical, DC, RF ■ Coupling Method: Grating coupling and edge coupling *For more details, please download the PDF or feel free to contact us.
- Company：Yonata Electronics
- Price：Other
